ECE 5620 - Digital System Testing

Credits: (3)
Typically taught:
Spring [Full Sem]

Fundamentals of testing digital circuits and memory devices, including fault modeling, test pattern generation, and test coverage. Introduction to design for test and built-in self-test. Laboratory activities include performing bench and automated testing of digital and memory chips, and generating test patterns for fault detection. Prerequisite: ECE 3610 - Digital Systems (4)