MFET 3650 - Quality Management Institute

Credits: (3)
This course consists of application process control and problem solving techniques including statistical process control (SPC), measurement systems analysis, and process capability analysis. Students will apply cause-and-effect diagrams, check sheets, sampling, line and bar charts, Pareto charts, scatter diagrams, variation, probability plots, x-R charts, gate repeatability and reproducibility (gage R & R) on course projects. Curriculum will include practical application exercises.
Pre-requisite(s): MFET 2410, MATH 1010 Intermediate Algebra or equivalent, and Basic Statistics course (MATH 1040) or equivalent.