Feb 26, 2021  
2020-2021 Catalog 
    
2020-2021 Catalog
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ECE 5620 - Digital System Testing

Credits: (3)
Typically Taught Spring Semester: Full Sem
Fundamentals of testing digital circuits and memory devices, including fault modeling, test pattern generation, and test coverage. Introduction to design for test and built-in self-test. Laboratory activities include performing bench and automated testing of digital and memory chips, and generating test patterns for fault detection.
Pre-requisite(s): ECE 3610 - Digital Systems (4)  
Note: Admittance into the Professional Program required.



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