Mar 28, 2024  
2020-2021 Catalog 
    
2020-2021 Catalog ARCHIVED CATALOG: Content may no longer be accurate.

Add to My Catalog (opens a new window)

ECE 5620 - Digital System Testing

Credits: (3)
Typically Taught Spring Semester: Full Sem
Fundamentals of testing digital circuits and memory devices, including fault modeling, test pattern generation, and test coverage. Introduction to design for test and built-in self-test. Laboratory activities include performing bench and automated testing of digital and memory chips, and generating test patterns for fault detection.
Pre-requisite(s): ECE 3610 - Digital Systems (4)  
Note: Admittance into the Professional Program required.



Add to My Catalog (opens a new window)