ECE 6620 - Digital System Testing

Credits: (3)
Typically Taught Spring Semester: Full Sem
Fundamentals of testing digital circuits and memory devices, including fault modeling, test pattern generation, and test coverage. Introduction to design for test and built-in self-test. Laboratory activities include performing bench and automated testing of digital and memory chips, and generating test patterns for fault detection.
Pre-requisite(s): ECE 3610.