Dec 27, 2024  
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MFET 3650  - Quality Management Institute

Credits: (3)
Description: This course consists of application process control and problem solving techniques including statistical process control (SPC), measurement systems analysis, and process capability analysis. Students will apply cause-and-effect diagrams, check sheets, sampling, line and bar charts, Pareto charts, scatter diagrams, variation, probability plots, x-R charts, gate repeatability and reproducibility (gage R & R) on course projects. Curriculum will include practical application exercises.
Pre-requisite(s): MFET 2410 , MATH 1010  Intermediate Algebra or equivalent, and Basic Statistics course (MATH 1040 ) or equivalent.


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